EddyCus TF map 2530SR Series Non-contact Sheet Resistance Imaging Device for Thin Films Characterization 
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Non-contact sheet resistance mapping
The EddyCus TF map 2530SR automatically measures the sheet resistance of large samples up to 300 x 300 mm² (12 x 12 inches) in non-contact mode. Upon manual sample positioning the device automatically measures and displays an accurate mapping of the sheet resistance across the entire sample area. The measurement settings allow easily and flexibly to choose between fast measurement times of below 1 minute or high spatial measurement resolution of more than 100,000 measurement points.
Advantages
- Non-contact real time measurement of substrates up to 300 x 300 m² (12 x 12 inches)
- High resolution mapping of conductive thin films
- Characterization even of hidden and encapsulated conductive layers
- Various software-integrated analysis functions (e.g. sheet resistance distribution, line scans, single point analysis)
- Measurement data saving and export functions
Measurement characteristics
- Sheet resistance
- Thin layer uniformity control
- Defect detection and coating analysis
- Measurement and mapping of metal layer thickness
- Quality control, input and output control
- Sample sizes: 50 x 50 mm² to 300 x 300 mm² (2 x 2 inches to 12 x 12 inches)
- Measurement range: 0.001 to 1,000 Ohm/sq
Applications
- Coated architectural glass, e.g. LowE
- Displays, touch screens and flat panel displays
- OLED and LED applications
- Smart glass
- Graphene layers
- Photovoltaic wafers and cells
- Semiconductor wafers
- Metallization layers and wafer metallization
- De-icing and heating applications
- Battery electrodes
- Conductively coated paper and conductive textiles
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Software and device control
- Very user-friendly software
- Real-time mapping measurement
- Easy-to-use statistical analysis options
- Various data analysis, data saving and export options
