EddyCus® TF dep 2020

Multi-purpose single point conductivity tester

 

The EddyCus TF dep (depth profiler) is a unique industrial eddy current measurement device utilizing frequencies from 10 kHz up to 100 MHz dedicated to the characterization of flat specimen. The variation of the measurement frequency allows the control of the penetration depth. The measurement with high frequencies benefits the characterization of near surface material characteristics of bulk materials and thin films. Additionally, the sensitivity increases with increasing measurement frequency. Therefore also very low conductive materials and layers can be characterized. Furthermore, the device supports the generation of depth profiles by utilization of multi frequency measurements. Measurement parameters are conductivity and related characteristics.

SURAGUS TF dep 2020 Conductivity Tester

 Applications and setups

  • Conductivity testing of bulk materials with different penetration depth
  • Material sorting
  • Metal layer thickness testing of conductive layers on non-conductive  materials
  • Paint thickness determination (lift-off) on conductive materials
  • Characterization of material properties such as hardness or microstructure in thin near surface layers of highly and low conductive materials

System characteristic

  • Customized sensor integration according measurement task (penetration depth, spot size, sensitivity)
  • Measurement field: 200 x 200 mm; measurement in the center
  • Positioning help for specimen
  • User friendly software for data tracking and data export

Another conductivity measurement devices

Stephan Adam


Stephan Adam
Sales Manager

+49 (0) 351 321 11-522
info@suragus.com

  What is 9 + 2?

By sending this form, I permit SURAGUS GmbH to send the information provided in this questionnaire to this e-mail address. All information remain inside the SURAGUS organization.

Enter additional information
Which physical parameter shall be analyzed? Sheet resistance Sheet thickness of conductive films
Additional measurement Optical transmission Anisotropy Substrate thickness measurement
What kind of testing system do you need? Singlepoint measurement device Mapping device In-line system
Boundary conditions

such as glass, foil or wafer

(Ohm/sq)

Additional information

By sending this form, I permit SURAGUS GmbH to send the information provided in this questionnaire to this e-mail address. All information remain inside the SURAGUS organization.