EddyCus® TF inline WT Series - Band and Wire Testing Systems

Non-Contact Conductive Wire and Band Testing Solutions for Process Control

The EddyCus® inline WT series are designed for the non-contact continuous inline testing of any conductive wire sharped materials. This solution enables process control, increase of yield, and incoming and outgoing goods inspection.

  • Applications / specimen
    • Conductive coatings on non-conductive materials (conductive coated glass fiber, coated threads)
    • Conductive wires (metal filaments and wires, metal fibers)
    • Conductive band (steal bands, susceptors)
    • Electrical cords and wires
    • Other conductive materials (carbon fiber materials such as roving or rods)
  • Physical values
    • Resistance per length [Ohm/m]
    • Sheet resistance [Ohm/sq],
    • Resistivity [Ohm cm]
    • Thickness / Volume [nm, µm]
  • Defect detection
    • Cracks
    • Coating defects and variation
    • Splice detection
    • Other defects that alter the electric characteristics or current flow (breakages, twist, splice, fuzz, fold, entanglement)
  • Geometry
    • Flat and round material
    • Diameter / width of 0.01 to 10 mm (other on request)
  • Sampling rate / measurement speed
    • 0.1 Hz to 50 kHz suitable for up to 50 m / s movement.
  • Benefits
    • Quality assurance
    • Process control
    • Yield inprovement
    • Customer trust by documented spool / roll report
  • Features
    • Magnetization
    • Alarming
Inline conductive wire testing sheet resistance sensor
Wire testing sensor
Inline conductive band testing sheet resistance sensor
Non-contact wire testing sensor
Inline conductive wires quality monitoring software
Quality monitor
thin film inline control software for wire testing
TF inline Control software
EddyCus® TF inline Control shows results of the sheet resistance testing of a metal band
TF inline Control software live view
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SURAGUS sales team
+49 351 321 11-522 or info@suragus.com

What is 8 × 5?
Enter additional information
Which physical parameter is to be characterized? Sheet resistance Sheet thickness of conductive films
Additional measurements Optical transmission Anisotropy Substrate thickness measurement
Which kind of measurement device do you need? Singlepoint measurement device Mapping device In-line system
Boundaries

wie Glas, Folie, Wafer

in Ohm/sq

Additional information