EddyCus® TF lab 2020

Non-contact sheet resistance and layer thickness measurement device for single point measurements

The EddyCus TF lab 2020 allows manual single point measurements of conductive thin films and layer thickness measurement of thin metal layers in non-contact mode. The compact bench-top device is ideal for fast and accurate measurements of samples up to 200 x 200 mm² (8 x 8 inches). In addition to the measurement of thin conductive layers also doped wafers and conductive polymers can be analyzed.

Advantages:

  • Non-contact real time measurement
  • Precise measurement of conductive thin films
  • Characterization of hidden and encapsulated conductive layers
  • Measurement data saving and export functions

Measurement characteristics:

  • Sheet resistance
  • Thickness measurement of metal layers
  • Single point measurement
  • Quality control, input and output control
  • Sample sizes: 10 x 10 mm² to 200 x 200 mm² (0.5 x 0.5 inches to 8 x 8 inches)
  • Measurement range: 0.001 to 3,000 Ohm/sq

Applications:

  • Coated architectural glass, e.g. LowE
  • Displays, touch screens and  flat panel displays
  • OLED and LED applications
  • Smart glass
  • Graphene layers
  • Photovoltaic wafers and cells
  • Semiconductor wafers
  • Metallization layers and wafer metallization
  • De-icing and heating applications
  • Battery electrodes
  • Conductively coated paper and conductive textiles
GET A QUOTE
Sheet resistance measurement device
Thin film measurement device
Thin film sheet resistance measurement device
wafer sheet resistance measurement device

Software and device control

  • Very user-friendly software
  • Intuitive, touch display navigation
  • Real-time measurement of sheet resistance and layer thickness
  • Software-assisted manual mapping option
  • Various data saving and export options
Software sheet resistance measurement TF lab 2020

Additional products in this section

Stephan Adam


Stephan Adam
Sales Manager

+49 (0) 351 321 11-522
info@suragus.com

  What is 8 × 4?

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Enter additional information
Which physical parameter shall be analyzed? Sheet resistance Sheet thickness of conductive films
Additional measurement Optical transmission Anisotropy Substrate thickness measurement
What kind of testing system do you need? Singlepoint measurement device Mapping device In-line system
Boundary conditions

such as glass, foil or wafer

(Ohm/sq)

Additional information

By sending this form, I permit SURAGUS GmbH to send the information provided in this questionnaire to this e-mail address. All information remain inside the SURAGUS organization.