EddyCus® TF lab 4040

Non-contact sheet resistance and layer thickness measurement device

The EddyCus TF lab 4040 is dedicated to non-contact single point sheet resistance measurement of larger substrates. The flexibly applicable bench-top device allows precise manual sheet resistance measurement of conductive thin films and the thickness of metal layers. Most common applications include the measurement of thin conductive layers, doped wafers and conductive polymers.

Advantages

  • Contactless measurement (real-time)
  • Precise measurement of conductive thin films on large substrates
  • Metal layer thickness measurement (nm)
  • Depiction of hidden and encapsulated conductive layers
  • Measurement results are storable

Measurement characteristics

  • Sheet resistance testing
  • Thickness measurement of metal layers
  • Single point measurement
  • Quality assurance
  • Sample sizes: 10 x 10 mm² to 400 x 400 mm² (0.5 x 0.5 inches to 16 x 16 inches)
  • Measurement range: 0.001 to 3,000 Ohm/sq

Applications

  • Coated architectural glass, e.g. LowE
  • Displays, touch screens and  flat panel displays
  • OLED and LED applications
  • Smart glass
  • Graphene layers
  • Photovoltaic wafers and cells
  • Semiconductor wafers
  • Metallization layers and wafer metallization
  • De-icing and heating applications
  • Battery electrodes
  • Conductively coated paper and conductive textiles
Sheet resistance measurement device TF lab 4040 Thin-film characterization device TF lab 4040 measurement of sheet resistance TF lab 4040 measurement of sheet resistance TF lab 4040

Software and device control

  • Very user-friendly software
  • Intuitive, touch display navigation
  • Real-time measurement of sheet resistance and layer thickness
  • Software-assisted manual mapping option
  • Various data saving and export options
Software sheet resistance measurement TF lab 4040

Optical transparency

Anisotropy

Measurement of sheet resistance and optical transparency: EddyCus TF lab Hybrid

The EddyCus TF lab Hybrid allows the simultaneous measurement of:

  • Sheet resistance (Ohm/sq)
  • Optical transparency / optical density / degree of production optical density (%)

The challenge in development and production of transparent, conductive layers includes to achieve the optimal compromise between:

  • Low sheet resistance (Ohm/sq)
  • Optical transparency/optical density (%)
  • Low costs (€/m² or USD/sq)

Depending on the application sheet resistance and optical transparency/optical density need to achieve and maintain a certain level. Additionally, the uniformity of sheet resistance and optical transparency/optical density, the local number of defects and for some layers the anisotropic sheet resistance are of interest.

In order to meet these challenges, SURAGUS offers hybrid solutions for research and development as well as for manufacturing companies.

Advantages

  • Non-contact and simultaneous real-time measurement of sheet resistance and optical transparency
  • Measurement even of encapsulated and hidden layers
  • Various data saving and export options

Measurement characteristics

  • Sheet resistance and optical transparency
  • Optimization of layer systems
  • Sheet resistance measurement range: 0.001 to 3,000 Ohm/sq
  • Measurement range of optical transparency: 0 – 100 %
Non-Contact_Large_Area_Graphene_Metrology_Mapping_SURAGUS_EddyCus_TF_lab_4040_Hybrid

Measurement of electrical anisotropy and sheet resistance: EddyCus TF lab 4040a

The measurement of the electrical anisotropy is especially relevant for applications of functional thin film which need to be conductive in a certain direction while maintaining high optical transparency. For manufacturing of certain coatings, anisotropic conductivity is important in order to achieve most efficient function. SURAGUS provides measurement devices with integrated sheet resistance anisotropy sensors in order to precisely measure the anisotropic sheet resistance.

Advantages and measurement characteristics

  • Precise of sheet resistance measurement of thin films (Ohm/sq oder mOhm/sq) and manual mapping of conductive layers (up to 400 x 400 mm² / 16 x 16 inches)
  • Thickness measurement of metal layers (nm)
  • Measurement even of encapsulated and hidden layers
  • Saving and export functions

Stephan Adam


Stephan Adam
Sales Manager

+49 (0) 351 321 11-522
info@suragus.com

  What is 7 × 1?

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Enter additional information
Which physical parameter shall be analyzed? Sheet resistance Sheet thickness of conductive films
Additional measurement Optical transmission Anisotropy Substrate thickness measurement
What kind of testing system do you need? Singlepoint measurement device Mapping device In-line system
Boundary conditions

such as glass, foil or wafer

(Ohm/sq)

Additional information

By sending this form, I permit SURAGUS GmbH to send the information provided in this questionnaire to this e-mail address. All information remain inside the SURAGUS organization.