EddyCus® TF portable 1010

Handheld device for sheet resistance measurement

The EddyCus TF portable is a handy and portable measurement device for fast contact measurement of large glasses and foils in production or in the field, for example for quick quality checks after manufacturing or as incoming good inspection. The handheld device allows the measurement even of hidden and encapsulated layers. It is an easy-to-use device that is controlled via a touch display.

Advantages

  • Small and portable measurement device
  • Fast and manual measurement
  • Characterization of hidden and encapsulated conductive layers

Ap­plic­a­tions

  • Con­tact­ing sheet res­ist­ance meas­ure­ment of con­duct­ive thin films
  • Single point meas­ure­ment in con­tact (con­stant dis­tance on re­quest)
  • Planar sur­faces from 150 x 150 mm (smal­ler areas on re­quest)
  • Qual­ity con­trol, in­com­ing in­spec­tion, in­spec­tion of out­go­ing goods

Vari­ants 

  • Sheet res­ist­ance R_sq in [Ohm/sq]
  • Thick­ness for metal­lic lay­ers [mµ, nm]
  • Emissiv­ity (e)

Areas of Application 

  • Architectural Glass (LowE)
  • Mirror Coatings
  • Reflective layers
  • Packaging foils
  • Electrode layers in smart / electrochromic glass and energy storage
  • Battery electrodes
  • Conductive paper and conductive textiles
Handheld Sheet Resistance Tester SURAGUS EddyCus TF Portable
SURAGUS TF portable sheet resistance testing
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SURAGUS EddyCus TF portable Sheet resistance tester totale
EddyCus TF portable back Sheet resistance tester
SURAGUS EddyCus TF portable sideview Sheet Resistance Measurement device
Sheet resistance tester in use Application Glass

Soft­ware and device con­trol

  • User-friendly user in­ter­face
  • Touch dis­play
  • Di­git­al data track­ing
  • Long bat­tery life­time (ap­prox­im­ately 10h in con­tinu­ous op­er­a­tion)
  • In­stant meas­ure­ment of sheet res­ist­ance and cor­rel­ated prop­er­ties such lay­er thick­ness and emissiv­ity
Software sheet resistance measurement tf portable

Product overview Sheet resistance and thickness measurement devices

Stephan Adam


Stephan Adam
Sales Manager

+49 (0) 351 321 11-522
info@suragus.com

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Enter additional information
Which physical parameter shall be analyzed? Sheet resistance Sheet thickness of conductive films
Additional measurement Optical transmission Anisotropy Substrate thickness measurement
What kind of testing system do you need? Singlepoint measurement device Mapping device In-line system
Boundary conditions

such as glass, foil or wafer

(Ohm/sq)

Additional information

By sending this form, I permit SURAGUS GmbH to send the information provided in this questionnaire to this e-mail address. All information remain inside the SURAGUS organization.