Crystalline Photovoltaic

Different high effiency wafer based cells are avaible. Cell and module manufacturing is cost driven. For achieving highest efficiency at lowest cost, the following deposition processes have to be monitored:

• Electrodes
  • Back contact
  • Front contact
  • Metal grid
• Buffer or seed layer
• Passivation layer
• Anti-reflective (AR) coatings
• Anti-scratch coatings

Testing

• Sheet resistance
• Conductivity
• Thickness
• Homogeneity
• Defectoscopy

Application

• Wafer testing
• Deposition process control
• Quality control
• Final inspection

Substrate

• Wafer
• Glass

Process

• Carrier
• S2S

Environment

• In-vacuo/ In-situ
• Ex-vacuo/ Ex-situ
• Inline
• Offline

Types

• HJT/ HIT
• PERC/ PERT
• TopCon
• IBC
• Tandem

For incoming inspection and characterization of deposition processes in crystalline photovoltaics SURAGUS refers to the following products: