Crystalline Photovoltaic

Different high effiency wafer based cell technologies are available in high volume manufacturing. Manufacturing costs are crucial for cells and modules. For achieving highest efficiency at lowest manfacturing cost, the following deposition processes have to be monitored:

  • Metal grid
  • Electrodes
  • Buffer or seed layer
  • Tunnel oxide
  • Passivation layer
Quality Control and Process Monitoring with High Frequency Eddy Current Technology

Testing

  • Sheet resistance
  • Conductivity
  • Thickness
  • Homogeneity
  • Defectoscopy

Application

  • Incoming inspection
  • Wafer testing
  • Deposition process control
  • Quality control
  • Final inspection

Substrate

  • n-type Si
  • p-type Si

Process

  • Inline
  • Carrier

Environment

  • In-vacuo and ex-vacuo
  • In-situ and ex-situ
  • Inline and offline

Types

  • HJT/ HIT
  • PERC/ PERT
  • TopCon
  • IBC
  • Tandem
  • Perovskite-HJT-Tandem

For incoming inspection and characterization of deposition processes in crystalline photovoltaics SURAGUS refers to the following products:

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