Thin-Film-Characterization

Stephan Adam


Stephan Adam
Sales Manager

+49 (0) 351 321 11-522
info@suragus.com

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Which physical parameter shall be analyzed? Sheet resistance Sheet thickness of conductive films
Additional measurement Optical transmission Anisotropy Substrate thickness measurement
What kind of testing system do you need? Singlepoint measurement device Mapping device In-line system
Boundary conditions

such as glass, foil or wafer

(Ohm/sq)

Additional information

By sending this form, I permit SURAGUS GmbH to send the information provided in this questionnaire to this e-mail address. All information remain inside the SURAGUS organization.