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The EddyCus® TF portable is a handy and portable measuring instrument for fast contact measurement of large glasses and foils in production or in the field, e.g. for fast quality checks after production or as incoming goods inspection. The handheld device also allows the measurement of concealed and encapsulated layers. It is an easy to use device, which is controlled by a touch display.
The EddyCus® TF lab 2020 enables manual single point measurements of conductive thin films and film thickness measurements of thin metal films in non-contact mode. The compact benchtop instrument is ideal for fast and accurate measurements of samples up to 200 x 200 mm² (8 x 8 inches). In addition to the measurement of thin conductive layers, doped wafers and conductive polymers can also be analyzed.
The EddyCus® TF lab 4040 is designed for non-contact single-point sheet resistance measurement of larger substrates. The flexible tabletop instrument allows precise manual sheet resistance measurements of conductive thin films and the thickness of metal layers. The most common applications include the measurement of thin conductive layers, doped wafers and conductive polymers.
The EddyCus® TF map 2525SR automatically measures the sheet resistance of large samples up to 250 x 250 mm² (10 x 10 inches) in non-contact mode. With manual sample positioning, the instrument automatically measures and displays an accurate image of the sheet resistance over the entire sample area. The measurement settings allow an easy and flexible choice between fast measurement times of less than 1 minute or a high spatial measurement resolution of more than 100,000 measurement points.
The EddyCus® TF map 5050SR is a non-contact mapping system for high-resolution mapping of sheet resistance or correlated properties such as metal thickness for scanning areas from 50 x 50 mm (2 x 2 inches) up to 500 x 500 mm (20 x 20 inches). The benchtop instrument automatically measures at various measuring points, typically with a slope in X and Y of 1 mm (40 mil), and produces accurate images of sheet resistance or thickness over the entire sample area. The resulting high-resolution property images, resulting from many thousands of measurement points, contain various information that is valuable for R&D and quality assurance.
The EddyCus TF inline series measures layer properties such as metal layer thickness or sheet resistance in non-contact on various substrates. Typical substrates are glass, foil, paper, wafer, plastic or ceramic. Measurements are obtained by permanent measurements or by trigger events to obtain equidistant results in fast moving coating processes or measure on specific positions on small specimen. Monitoring is possible in atmosphere and in vacuum. The measurements are obtained using high samples rate and can be directly provided for process control systems and customer software. Additionally SURAGUS offers the monitoring software EddyCus TF control that visualizes, stores and analyses metrology data.
Eddy Current full-area monitoring is achieved by by use of EddyCus TF array solution. SURAGUS provide stackable 8 Sensor Modules which allow depending on its configuration the inline monitoring on upto 128 measurement lanes
EddyCus full-area inline solutions help to monitor the entire width of small and large area coatings. This enables to track the complete product and process quality optimally. Since you can only improve things that you can measure, our solution enables you to optimize your product and process quality. This gives you a big advantage over your competitors. With our software it is easy to analyze your data perfectly. It is really simple to monitor the process and product data and let you improve your output while monitoring your product quality and process data.
The EddyCus® inline WT series are designed for the non-contact continuous inline testing of any conductive wire sharped materials. This solution enables process control, increase of yield, and incoming and outgoing goods inspection.
|Sheet resistance (SR)||Metal thickness (MT)||Conductivity / structure / defects (CT)||Optical transparency/ density (OT)||Electrical (an)isotropy (AI)|
|Handheld||EddyCus® TF portable 1010SR||EddyCus® TF portable 1010SR|
|Single point||EddyCus® TF lab 2020SR EddyCus® TF lab 4040SR EddyCus TF lab 4040SR-OT||EddyCus® TF lab 2020SR EddyCus® TF lab 4040SR EddyCus TF lab 4040SR-OT||EddyCus® TF lab 2020RM EddyCus® TF portable 1010CT||EddyCus TF lab 4040SR-OT||EddyCus® TF lab 4040SR-A|
|Imaging||EddyCus® TF map 2530SR EddyCus® TF map 2525SR EddyCus® TF map 5050SR||EddyCus® TF map 2530SR EddyCus® TF map 2525SR EddyCus® TF map 5050SR||EddyCus® TF map 5050SR EddyCus® TF map 5050CT||EddyCus® TF map 5050SR-A|
|Inline||EddyCus® TF inline SR EddyCus® TF inline Sensorline EddyCus® TF inline EddyCus TF inline PE||EddyCus® TF inline SR EddyCus TF inline PE||EddyCus TF inline SR-A|
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