Stephan Adam

Stephan Adam
Sales Manager

+49 351 321 11-522

What is 9 × 8?
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Which physical parameter is to be characterized? Sheet resistance Sheet thickness of conductive films
Additional measurements Optical transmission Anisotropy Substrate thickness measurement
Which kind of measurement device do you need? Singlepoint measurement device Mapping device In-line system

wie Glas, Folie, Wafer

in Ohm/sq

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