EddyCus® TF map 2525SR

Non-contact sheet resistance mapping

The Eddy­Cus TF map 2525SR auto­mat­ic­ally meas­ures the sheet res­ist­ance of large samples up to 250 x 250 mm² (10 x 10 inches) in non-con­tact mode. Upon manu­al sample po­s­i­tion­ing the device auto­mat­ic­ally meas­ures and dis­plays an ac­cur­ate map­ping of the sheet res­ist­ance across the en­tire sample area. The meas­ure­ment set­tings al­low eas­ily and flex­ibly to choose between fast meas­ure­ment times of be­low 1 minute or high spa­tial meas­ure­ment res­ol­u­tion of more than 100,000 meas­ure­ment points.

Advantages

  • Non-contact real time measurement of substrates up to 250 x 250 m² (10 x 10 inches)
  • High resolution mapping of conductive thin films
  • Characterization even of hidden and encapsulated conductive layers
  • Various software-integrated analysis functions (e.g. sheet resistance distribution, line scans, single point analysis)
  • Measurement data saving and export functions

Measurement characteristics

  • Sheet resistance
  • Thin layer uniformity control
  • Defect detection and coating analysis
  • Measurement and mapping of metal layer thickness
  • Quality control, input and output control
  • Sample sizes: 50 x 50 mm² to 250 x 250 mm² (2 x 2 inches to 10 x 10 inches)
  • Measurement range: 0.001 to 1,000 Ohm/sq

Applications

  • Coated architectural glass, e.g. LowE
  • Displays, touch screens and  flat panel displays
  • OLED and LED applications
  • Smart glass
  • Graphene layers
  • Photovoltaic wafers and cells
  • Semiconductor wafers
  • Metallization layers and wafer metallization
  • De-icing and heating applications
  • Battery electrodes
  • Conductively coated paper and conductive textiles
Sheet resistance mapper measurement field 2525SR
Schichtwiderstands-Mapping-Messfeld-TF-map-2525SR.JPG
Mapping of sheet resistance TF map 2525SR
Eddycus TF map 2525SR sheet resistance mapping device
Thin-film sheet resistance mapper TF map 2525SR

Software and device control

  • Very user-friendly software
  • Real-time mapping measurement
  • Easy-to-use statistical analysis options
  • Various data analysis, data saving and export options
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Additional products in this section

Optical transparency & sheet resistance

Electrical anisotropy & sheet resistance

Measurement/Mapping of sheet resistance and optical transparency

The challenge in development and production of transparent, conductive layers includes to achieve the optimal compromise between:

  • Low sheet resistance (Ohm/sq)
  • Optical transparency/optical density (%)
  • Low costs (€/m² or USD/sq)

Depending on the application sheet resistance and optical transparency/optical density need to achieve and maintain a certain level. Additionally, the uniformity of sheet resistance and optical transparency/optical density, the local number of defects and for some layers the anisotropic sheet resistance are of interest.

In order to meet these challenges, SURAGUS offers hybrid solutions for research and development as well as for manufacturing companies.

The EddyCus TF map Hybrid allows the simultaneous measurement:

  • Sheet resistance (Ohm/sq)
  • Optical transparency / optical density / degree of production optical density (%)

Advantages

  • Non-contact and simultaneous real-time mapping measurement of sheet resistance and optical transparency
  • Measurement even of encapsulated and hidden layers
  • Various software-integrated analysis functions (e.g. sheet resistance distribution, line scans, single point analysis)
  • Various data saving and export options

Measurement characteristics

  • Sheet resistance and optical transparency
  • Optimization of layer systems
  • Automated mapping measurements
  • Quality control, input and output control
  • Sample sizes: 50 x 50 mm² to 250 x 250 mm² (2 x 2 inches to 10 x 10 inches)
  • Measurement range of sheet resistance: 0.001 to 1,000 Ohm/sq
  • Measurement range of optical transparency: 0 – 100 %

Applications

  • Coated architectural glass, e.g. LowE
  • Displays, touch screens and  flat panel displays
  • Smart glass
  • Graphene layers
  • De-icing and heating applications

Additional product in this section

Measurement of electrical anisotropy

Non-contact measurement of electrical anisotropy and a sheet resistance anisotropy during production.

The EddyCus TF inline sensors can easily be integrated into production lines and coating machines in order to monitor the electrical anisotropy and isotropic sheet resistance during production. Measurements are fast, reliable and accurate in non-contact mode without harming the sample surface.

Advantages

  • Non-contact real-time measurement of sheet resistance anisotropy of thin films
  • Customized inline solutions for integrated quality control in automated production lines
  • In-vacuo and ex-vacuo sensors
  • Multi-lane testing, temperature stabilized
  • Traversing system available
  • Measurement even of encapsulated and hidden layers
  • Various data saving and export functions

Measurement characteristics

  • Characterization of electrically anisotropic layers
  • Roll2roll and sheet2sheet production monitoring
  • Optimization of layer systems
  • Thin layer and sheet resistance anisotropy uniformity control
  • Quality control, input and output control
  • Sample width: 50 mm up to 4 m and more (2’’ – 13’ and more)
  • Measurement range of sheet resistance: 0.001 to 1,000 Ohm/sq
  • Measurement range of anisotropic sheet resistance: 0.1 to 250 Ohm/sq

Applications

  • TCO-production
  • Displays, touch screens and  flat panel displays
  • Smart glass
  • De-icing and heating applications

Additional product in this section

Stephan Adam


Stephan Adam
Sales Manager

+49 (0) 351 321 11-522
info@suragus.com

  What is 6 - 1?

By sending this form, I permit SURAGUS GmbH to send the information provided in this questionnaire to this e-mail address. All information remain inside the SURAGUS organization.

Enter additional information
Which physical parameter shall be analyzed? Sheet resistance Sheet thickness of conductive films
Additional measurement Optical transmission Anisotropy Substrate thickness measurement
What kind of testing system do you need? Singlepoint measurement device Mapping device In-line system
Boundary conditions

such as glass, foil or wafer

(Ohm/sq)

Additional information

By sending this form, I permit SURAGUS GmbH to send the information provided in this questionnaire to this e-mail address. All information remain inside the SURAGUS organization.